 | 姓名 | 刘智 |
| 职务/职称 | 讲师 | |
| 研究方向 | 软件加固技术，人工智能可靠性，物联网技术 |
刘智，现任于江苏理工学院讲师，博士毕业于河海大学。曾在常州新科汽车电子和江苏国光信息产业股份公司任职工程师，参与多项企业的项目设计和开发。发表过多篇SCI论文和发明专利，参与多项横向项目。
论文发表：
[1]Liu, Z., Liu, Y., Chen, Z., Guo, G., & Wang, H. (2021). Analyzing and increasing soft error resilience of Deep Neural Networks on ARM processors. Microelectronics Reliability, 124, 114331.
[2]Liu, Z., & Yang, X. (2022). An efficient structure to improve the reliability of deep neural networks on ARMs. Microelectronics Reliability.
[3]Liu, Z., Deng, Z., & Yang, X. (2022). Using checksum to improve the reliability of embedded convolutional neural networks. Microelectronics Reliability.
[4]Wang, H., Peng, X., Liu, Z., Huang, X., Qiu, L., Li, T., Yang, B., & Chen, Y. (2024). Revisiting row hammer: A deep dive into understanding and resolving the issue. Microelectronics Reliability.
[5] Ibrahim, Y.M., Wang, H., Bai, M., Liu, Z., Wang, J., Yang, Z., & Chen, Z. (2020). Soft Error Resilience of Deep Residual Networks for Object Recognition. IEEE Access, 8, 19490-19503.
